Because of the problem in the OM electronics neither flatfield nor darkframe images were acquired at CSL. Although such measurements are available for the intensifier, these measurements are not directly usable, because they provide relative positional information only. I.e. these measurements are suitable to quantify defects, but not to derive their exact position. The CCD used in these measurements had an arbitrary location in respect to the intensifier. Two images were taken with the CCD rotated by 90 degree to distinguish between intensifier and CCD defects.
The relative position of identified defects to each other can be derived. Study is ongoing whether these defects can be found in the CSL image. In this case these pixels will be added to the badpix file.